Temperature Controlled Power Semiconductor Characterization using Thermoelectric Coolers

New York, NY / IEEE (2018) [Journal Article]

IEEE transactions on industry applications : IA
Volume: 54
Issue: 3
Page(s): i-viii

Authors

Selected Authors

Engelmann, Georges
Laumen, Michael
Gottschlich, Jan
Oberdieck, Karl
de Doncker, Rik Wivina Anna

Identifier