Experimental analysis of the switching behavior of an IGBT using a three-stage gate driver

Piscataway, NJ / IEEE (2017) [Contribution to a book, Contribution to a conference proceedings]

2017 IEEE 8th International Symposium on Power Electronics for Distributed Generation Systems (PEDG) : Florianópolis, Brazil, April 17th-20th, 2017

Authors

Selected Authors

Engelmann, Georges
Lüdecke, Christoph
Bündgen, David
de Doncker, Rik W.
Lu, Xi

Other Authors

Xu, Zhuxian
Zou, Ke

Identifier