Experimental Comparison of Voltage andCurrent Source Gate Drivers for IGBTs

(2017) [Contribution to a book, Contribution to a conference proceedings]

[2017 IEEE 12th International Conference on Power Electronics & Drive Systems, IEEE PEDS 2017, 2017-12-12 - 2017-12-15, Honolulu, Hawai, USA]


Selected Authors

Lüdecke, Christoph
Engelmann, Georges
Oberdieck, Karl
Bündgen, David
de Doncker, Rik W.


  • URN: https://ieee-peds-2017.com/wp-content/uploads/2017/11/83.pdf
  • REPORT NUMBER: RWTH-2017-10771